A model for electroelastic plates under biasing fields with applications in buckling analysis
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Publication:1858734
DOI10.1016/S0020-7683(02)00122-1zbMath1043.74013OpenAlexW1965430287MaRDI QIDQ1858734
Qing Jiang, Yuan-Tai Hu, Jia-shi Yang
Publication date: 17 February 2003
Published in: International Journal of Solids and Structures (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/s0020-7683(02)00122-1
Related Items (4)
Buckling of a Reissner-Mindlin plate of piezoelectric semiconductors ⋮ The mechanism to reform dynamic performance of an elastic wave-front in a piezoelectric semiconductor by the wave-carrier interaction induced from static biasing fields ⋮ Thickness-shear vibration of circular crystal plate in cylindrical shell as pressure sensor ⋮ Buckling delamination of a sandwich plate-strip with piezoelectric face and elastic core layers
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