Application of the simulated annealing local search technique to problems of redundancy elimination in functional and parametric tests of integrated circuits
From MaRDI portal
Publication:1873059
DOI10.1016/S0378-4754(02)00222-7zbMath1023.65057MaRDI QIDQ1873059
J. Feller, L. J. Stuehler, J. S. Ledford, W. T. jun. O'Grady, W. Mergenthaler, B. Mauersberg
Publication date: 19 May 2003
Published in: Mathematics and Computers in Simulation (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/s0378-4754(02)00222-7
numerical example; combinatorial optimization; simulated annealing; integrated circuits; redundancy elimination; test cost reduction
65K05: Numerical mathematical programming methods
90C27: Combinatorial optimization
94C05: Analytic circuit theory
Cites Work