The electrically induced stress in the dielectric of a transmission coaxial line

DOI10.1016/S1007-5704(03)00125-4zbMATH Open1065.78015OpenAlexW2058537517MaRDI QIDQ1886396FDOQ1886396

Authors: Yumin Xiang, Weigan Lin 

Publication date: 18 November 2004

Published in: Communications in Nonlinear Science and Numerical Simulation (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/s1007-5704(03)00125-4

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zbMATH Keywords

ElectrostrictionConformal mappingStress distributionTransmission line

Mathematics Subject Classification ID

General topics in optics and electromagnetic theory (78A99)

Cites Work

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Cited In (2)

• Electric field strength at and near the cathode edge in a magnetically insulated coaxial diode
• Distributed capacitance of coaxial line with perturbed walls

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