The electrically induced stress in the dielectric of a transmission coaxial line

DOI10.1016/S1007-5704(03)00125-4MaRDI QIDQ1886396zbMATHOpenAlexFDO

Authors Yumin Xiang, Weigan Lin

Publication date 18 November 2004

Published in Communications in Nonlinear Science and Numerical Simulation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/s1007-5704(03)00125-4

zbMATH Keywords

ElectrostrictionConformal mappingStress distributionTransmission line

Mathematics Subject Classification ID

General topics in optics and electromagnetic theory (78A99)

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(2)

• Electric field strength at and near the cathode edge in a magnetically insulated coaxial diode
• Distributed capacitance of coaxial line with perturbed walls

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