Geometric linear discriminant analysis for pattern recognition

DOI10.1016/J.PATCOG.2003.07.002zbMATH Open1072.68096OpenAlexW2023910880MaRDI QIDQ1886641FDOQ1886641

Authors: Mark Ordowski, Gerard G. L. Meyer 

Publication date: 18 November 2004

Published in: Pattern Recognition (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.patcog.2003.07.002

Recommendations

• Linear dimensionality reduction by maximizing the Chernoff distance in the transformed space
• An analytical algorithm for determining the generalized optimal set of discriminant vectors
• A comparison of generalized linear discriminant analysis algorithms
• Dimension reduction and construction of feature space for image pattern recognition
• Multiclass classifiers based on dimension reduction with generalized LDA

zbMATH Keywords

Bhattacharyya boundDimensionality reductionBayes classifierLinear discriminant analysisLinear transformationStatistical pattern recognitionSymmetric divergence

Mathematics Subject Classification ID

Pattern recognition, speech recognition (68T10)

Cites Work

• Title not available (Why is that?)
• Title not available (Why is that?)
• Title not available (Why is that?)
• Title not available (Why is that?)
• On feature extraction in multi-class pattern recognition†
• Title not available (Why is that?)

Cited In (4)

• Fast Algorithms for the Generalized Foley–Sammon Discriminant Analysis
• Title not available (Why is that?)
• Dimension reduction and construction of feature space for image pattern recognition
• Linear dimensionality reduction by maximizing the Chernoff distance in the transformed space

This page was built for publication: Geometric linear discriminant analysis for pattern recognition

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q1886641)