Dual BIE approaches for modeling electrostatic MEMS problems with thin beams and accelerated by the fast multipole method

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Publication:1958244

DOI10.1016/j.enganabound.2006.04.010zbMath1195.78068OpenAlexW2101257082MaRDI QIDQ1958244

Yijun J. Liu

Publication date: 28 September 2010

Published in: Engineering Analysis with Boundary Elements (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.enganabound.2006.04.010



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