Reliability analysis for devices subject to competing failure processes based on chance theory

DOI10.1016/j.apm.2019.05.036zbMath1481.60188MaRDI QIDQ1985115

Baoliang Liu, Zhi-Qiang Zhang, Yanqing Wen

Publication date: 7 April 2020

Published in: Applied Mathematical Modelling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.apm.2019.05.036

zbMATH Keywords

shock models; uncertainty theory; uncertain variable; uncertain distribution; competing failure processes

Mathematics Subject Classification ID

90B25: Reliability, availability, maintenance, inspection in operations research

90C70: Fuzzy and other nonstochastic uncertainty mathematical programming

60K10: Applications of renewal theory (reliability, demand theory, etc.)

60G55: Point processes (e.g., Poisson, Cox, Hawkes processes)