Reliability analysis for devices subject to competing failure processes based on chance theory

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Publication:1985115

DOI10.1016/J.APM.2019.05.036zbMATH Open1481.60188OpenAlexW2947513710WikidataQ127820044 ScholiaQ127820044MaRDI QIDQ1985115FDOQ1985115

Yanqing Wen, Zhi-Qiang Zhang, Baoliang Liu

Publication date: 7 April 2020

Published in: Applied Mathematical Modelling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.apm.2019.05.036





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