Enhancing the accuracy of software reliability prediction through quantifying the effect of test phase transitions

DOI10.1016/J.AMC.2012.08.083MaRDI QIDQ2017914zbMATH OpenOpenAlexFDO

Authors Chu-Ti Lin

Publication date 23 March 2015

Published in Applied Mathematics and Computation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.amc.2012.08.083

zbMATH Keywords

software reliabilitynon-homogeneous Poisson process (NHPP)software reliability growth model (SRGM)test efforttest phase transition

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25) Theory of software (68N99)

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Cites work

• scientific article; zbMATH DE number 3833669 (Why is no real title available?)
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• scientific article; zbMATH DE number 1324840 (Why is no real title available?)
• scientific article; zbMATH DE number 786732 (Why is no real title available?)
• A General Empirical Solution to the Macro Software Sizing and Estimating Problem
• A hierarchical mixture model for software reliability prediction
• Analysis of Software Reliability Modeling Considering Testing Compression Factor and Failure-to-Fault Relationship
• Enhancing software reliability modeling and prediction through the introduction of time-variable fault reduction factor
• Joint effect of test effort and learning factor on software reliability and optimal release policy
• Optimisation analysis for reliability assessment based on stochastic differential equation modelling for open source software
• Sensitivity analysis of release time of software reliability models incorporating testing effort with multiple change-points
• Software release policies on a shot-noise process model
• Software reliability analysis and assessment using queueing models with multiple change-points
• Software reliability modeling with removed errors and compounded-decreased-rate
• Software-reliability growth with a Weibull test-effort: a model and application

Cited in

(2)

• Recursive approach for multiple step-ahead software fault prediction through long short-term memory (LSTM)
• A test coverage-based model for predicting software fault content and location during multi-phase functional testing

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