Optimal Bayesian experimental design for electrical impedance tomography in medical imaging
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Publication:2020795
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Cites work
- scientific article; zbMATH DE number 3241743 (Why is no real title available?)
- A Mathematical Theory of Communication
- Bayesian inversion for electrical-impedance tomography in medical imaging using the nonlinear Poisson-Boltzmann equation
- Complexity analysis of accelerated MCMC methods for Bayesian inversion
- Efficient Bayesian experimentation using an expected information gain lower bound
- Electrical Impedance Tomography
- Electrical impedance tomography
- Existence and local uniqueness for 3D self-consistent multiscale models of field-effect sensors
- Fast estimation of expected information gains for Bayesian experimental designs based on Laplace approximations
- GRADIENT-BASED STOCHASTIC OPTIMIZATION METHODS IN BAYESIAN EXPERIMENTAL DESIGN
- Inverse Problem Theory and Methods for Model Parameter Estimation
- Inverse problems: a Bayesian perspective
- Least squares quantization in PCM
- Multivariate stochastic approximation using a simultaneous perturbation gradient approximation
- Nonstationary inverse problems and state estimation
- On Information and Sufficiency
- On a Measure of the Information Provided by an Experiment
- Optimizing electrode positions in electrical impedance tomography
- Posterior covariance related optimal current patterns in electrical impedance tomography
- Sparse deterministic approximation of Bayesian inverse problems
Cited in
(7)- Level set and optimal control for the inverse inclusion reconstruction in electrical impedance tomography modeling
- Bayesian experimental design for head imaging by electrical impedance tomography
- Sensor placement via optimal experiment design in EMI sensing of metallic objects
- Bayesian optimal design accelerates discovery of soft material properties from bubble dynamics
- Well-posed questions for ill-posed inverse problems: a note in memory of Pierre Sabatier
- Bayesian inversion for the identification of the doping profile in unipolar semiconductor devices
- Whittle-Matérn priors for Bayesian statistical inversion with applications in electrical impedance tomography
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