On the worst-case side-channel security of ECC point randomization in embedded devices

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Publication:2152029

DOI10.1007/978-3-030-65277-7_9zbMath1492.94060OpenAlexW3107238311MaRDI QIDQ2152029

Kostas Papagiannopoulos, Romain Poussier, Vincent Verneuil, Melissa Azouaoui, François Durvaux, François-Xavier Standaert

Publication date: 6 July 2022

Full work available at URL: https://doi.org/10.1007/978-3-030-65277-7_9







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