Dependent microstructure noise and integrated volatility estimation from high-frequency data
DOI10.1016/J.JECONOM.2019.10.004zbMATH Open1456.62253arXiv1704.08964OpenAlexW2983690364WikidataQ126852311 ScholiaQ126852311MaRDI QIDQ2182144FDOQ2182144
Authors: Z. Merrick Li, Roger J. A. Laevent, M. H. Vellekoop
Publication date: 21 May 2020
Published in: Journal of Econometrics (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/1704.08964
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bias correctionrealized volatilityintegrated volatilitydependent microstructure noisepre-averaging method
Non-Markovian processes: estimation (62M09) Applications of statistics to actuarial sciences and financial mathematics (62P05)
Cites Work
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- Title not available (Why is that?)
- Mixing properties of ARMA processes
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- Microstructure Noise, Realized Variance, and Optimal Sampling
- Designing Realized Kernels to Measure the ex post Variation of Equity Prices in the Presence of Noise
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- Limit theorems for moving averages of discretized processes plus noise
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- Efficient estimation of integrated volatility incorporating trading information
- Estimation for high-frequency data under parametric market microstructure noise
- Estimating the integrated volatility with tick observations
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- Efficient asymptotic variance reduction when estimating volatility in high frequency data
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Cited In (11)
- High frequency market microstructure noise estimates and liquidity measures
- On estimating market microstructure noise variance
- Asymptotic normality of Nadaraya–Waton kernel regression estimation for mixing high-frequency data
- Estimating the integrated volatility using high-frequency data with zero durations
- Ultra high frequency volatility estimation with dependent microstructure noise
- Microstructure noise in the continuous case: the pre-averaging approach
- Efficient estimation of integrated volatility incorporating trading information
- Nonparametric estimation for high-frequency data incorporating trading information
- Local mispricing and microstructural noise: a parametric perspective
- Bias-corrected realized variance under dependent microstructure noise
- Frequency Domain Estimation of Integrated Volatility for Itô Processes in the Presence of Market-Microstructure Noise
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