Exact likelihood-ratio tests for a simple step-stress cumulative exposure model with censored exponential data

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Publication:2195943

DOI10.1007/s11009-019-09719-3zbMath1448.62031OpenAlexW2943822880WikidataQ115603565 ScholiaQ115603565MaRDI QIDQ2195943

Xiaojun Zhu, Yiliang Zhou, Narayanaswamy Balakrishnan

Publication date: 28 August 2020

Published in: Methodology and Computing in Applied Probability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s11009-019-09719-3



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