Nonlinear dynamics and bifurcations in external feedback control of microcantilevers in atomic force microscopy
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Publication:2257448
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Cites work
- Applications of centre manifold theory
- Bifurcations and trajectories joining critical points
- Degenerate discontinuity-induced bifurcations in tapping-mode atomic-force microscopy
- Detection of homoclinic bifurcations in resonance zones of forced oscillators
- Elements of applied bifurcation theory
- Handbook of Chaos Control
- scientific article; zbMATH DE number 3651791 (Why is no real title available?)
- scientific article; zbMATH DE number 1219618 (Why is no real title available?)
- Melnikov-based dynamical analysis of microcantilevers in scanning probe microscopy
- New control methodology of microcantilevers in atomic force microscopy
- Nonlinear oscillations, dynamical systems, and bifurcations of vector fields
- NUMERICAL DETECTION AND CONTINUATION OF CODIMENSION-TWO HOMOCLINIC BIFURCATIONS
- Numerical Detection and Continuation of Homoclinic Points and Their Bifurcations for Maps and Periodically Forced Systems
Cited in
(13)- Dynamical analysis and control of microcantilevers
- Equilibrium and bifurcation of varying cross-section microcantilevers subject to the atomic force
- Nonlinear dynamics of atomic–force–microscope probes driven in Lennard–Jones potentials
- Exploiting global dynamics of a noncontact atomic force microcantilever to enhance its dynamical robustness via numerical control
- New control methodology of microcantilevers in atomic force microscopy
- Families of solitons in Bragg supergratings
- Asymptotic analysis of a noncontact AFM microcantilever sensor with external feedback control
- Bifurcation analysis of a microcantilever in AFM system
- Bifurcation analysis and complex phenomena in self-excited microcantilevers
- Nonlinear dynamic analysis of a V-shaped microcantilever of an atomic force microscope
- Nonlinear dynamics, stability and control of the scan process in noncontacting atomic force microscopy
- Van der Pol type self-excited micro-cantilever probe of atomic force microscopy
- Degenerate discontinuity-induced bifurcations in tapping-mode atomic-force microscopy
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