Rank tests for one sample, two samples, and k samples without the assumption of a continuous distribution function
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Publication:2265772
DOI10.1214/AOS/1176342560zbMATH Open0275.62042OpenAlexW2001891483MaRDI QIDQ2265772FDOQ2265772
Authors: W. J. Conover
Publication date: 1973
Published in: The Annals of Statistics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1214/aos/1176342560
Nonparametric hypothesis testing (62G10) Asymptotic properties of nonparametric inference (62G20) Asymptotic distribution theory in statistics (62E20)
Cited In (23)
- On testing hypotheses in the generalized Skillings-Mack random blocks setting
- Linear rank score statistics when ties are present
- Linear models analysis of small samples of categorized ordinal response data
- A class of adaptive distribution-free procedures
- ANOVA and rank tests when the number of treatments is large
- The multi-aspect tests in the presence of ties
- Asymptotic power efficiency for a location and scale problem
- Generalized order statistics from arbitrary distributions and the Markov chain property
- Comparisons of the asymptotic efficiencies of two sample tests for discrete distributions
- Two remarks on order statistics
- Asymptotic efficiency of the sum of squared ranks test for discrete distributions
- A survey of nonparametric tests for scale
- Rank tests and ties - some properties of a rank test for complete block designs -
- Tests on asymmetry for ordered categorical variables
- How robust are tests for two independent samples?
- Title not available (Why is that?)
- A decision theoretic approach to ridits
- An omnibus consistent adaptive percentile modified Wilcoxon rank sum test with applications in gene expression studies
- Midrank unification of rank tests for exact, tied, and censored data
- An adaptive test for the one‐way layout
- The treatment of ties in some linear rank tests when the underlying distribution is discrete
- Title not available (Why is that?)
- On the asymptotic efficiency of the multisample location-scale rank tests and their adjustment for ties
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