Diagnostic tests for contact circuits

DOI10.3103/S0027132219020049zbMATH Open1419.94096OpenAlexW2944178483WikidataQ127943777 ScholiaQ127943777MaRDI QIDQ2320005FDOQ2320005

Nikolay P. Red'kin

Publication date: 21 August 2019

Published in: Moscow University Mathematics Bulletin (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.3103/s0027132219020049

zbMATH Keywords

Boolean functioncontact circuitsfull diagnostic testone-type contact faults

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Boolean functions (94D10)

Cites Work

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Cited In (6)

• Single tests for contacts
• Single tests for connected faults of contact networks
• Depth of a conditional full diagnostic test for contact circuits implementing a parity counter
• Short tests of closures for contact circuits
• Short fault detection tests for contact circuits under arbitrary weakly connected faults of contacts
• Title not available (Why is that?)

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