Discordancy tests for two-parameter exponential samples

DOI10.1007/S00362-014-0597-3zbMATH Open1371.62012OpenAlexW2141732028MaRDI QIDQ2340403FDOQ2340403

Authors: Chien-Tai Lin, Shih-Chun Wang 

Publication date: 16 April 2015

Published in: Statistical Papers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s00362-014-0597-3

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zbMATH Keywords

Monte Carlo studycritical valuesspacingssequential testingmasking effectblock test proceduresdiscordancy testsswamping effecttwo-parameter exponential samples

Mathematics Subject Classification ID

Exact distribution theory in statistics (62E15) Parametric hypothesis testing (62F03) Sequential statistical analysis (62L10) Robustness and adaptive procedures (parametric inference) (62F35)

Cites Work

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• Exact computation of the null distribution of a test for multiple outliers in an exponential sample
• Comparison of many outlier procedures for exponential samples
• Masking Effect on Tests for Outliers in Exponential Models
• Testing for Upper Outliers in Gamma Sample
• A New Statistic for Detecting Outliers in Exponential Case
• Tests for upper outliers in the two-parameter exponential distribution
• Discordancy tests for two-parameter exponential samples

Cited In (13)

• Package mTEXO for testing the presence of outliers in exponential samples
• Some Tests fork£2 Upper Outliers in an Exponential Sample
• Discordancy tests for two-parameter exponential samples
• Tests for upper outliers in the two-parameter exponential distribution
• Exact distributions of tests of outliers for exponential samples
• Discordancy Testing in Gamma Samples with Both Parameters Unknown
• Tests for multiple outliers in an exponential sample
• Comparison of many outlier procedures for exponential samples
• Exact tests for outliers in Laplace samples
• Testing for multiple upper and lower outliers in an exponential sample
• Two-Sample Dispersion Tests for Interval-Valued Data
• A note on determining the number of outliers in an exponential sample by least squares procedure
• Masking Effect on Tests for Outliers in Exponential Models

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