Extending the relevant component analysis algorithm for metric learning using both positive and negative equivalence constraints
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(9)- scientific article; zbMATH DE number 5957283 (Why is no real title available?)
- Distance metric learning guided adaptive subspace semi-supervised clustering
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- Ordinal margin metric learning and its extension for cross-distribution image data
- Non-linear metric learning using pairwise similarity and dissimilarity constraints and the geometrical structure of data
- Supervised distance metric learning through maximization of the Jeffrey divergence
- Supervised principal component analysis: visualization, classification and regression on subspaces and submanifolds
- Learning a Mahalanobis distance metric for data clustering and classification
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