Monitoring high-yields processes with defects count in nonconforming items by artificial neural network

DOI10.1016/J.AMC.2006.09.114MaRDI QIDQ2371430zbMATH OpenOpenAlexFDO

Authors Babak Abbasi, Seyed Taghi, Akhavan Niaki

Publication date 4 July 2007

Published in Applied Mathematics and Computation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.amc.2006.09.114

zbMATH Keywords

artificial neural networkgeneralized Poisson modelhigh-yields processesstatistical process control

Mathematics Subject Classification ID

Neural nets and related approaches to inference from stochastic processes (62M45) Applications of statistics in engineering and industry; control charts (62P30)

Recommendations

• Detection and classification mean-shifts in multi-attribute processes by artificial neural networks
• On the monitoring of multi-attributes high-quality production processes
• Modified Shewhart charts for high yield processes
• EWMA control charts for monitoring high yield processes
• Cumulative sum charts for high yield processes

Cites work

• A neural network approach for the analysis of control chart patterns
• scientific article; zbMATH DE number 51537 (Why is no real title available?)
• scientific article; zbMATH DE number 194136 (Why is no real title available?)
• scientific article; zbMATH DE number 568891 (Why is no real title available?)
• scientific article; zbMATH DE number 605915 (Why is no real title available?)
• Zero-Inflated Poisson Regression, with an Application to Defects in Manufacturing

Cited in

(2)

• Approximate distribution of demerit statistic -- a bounding approach
• Monitoring a bi-attribute high-quality process using a mixture probability distribution

This page was built for publication: Monitoring high-yields processes with defects count in nonconforming items by artificial neural network

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q2371430)