Surrogate regret bounds for generalized classification performance metrics
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Publication:2398092
Abstract: We consider optimization of generalized performance metrics for binary classification by means of surrogate losses. We focus on a class of metrics, which are linear-fractional functions of the false positive and false negative rates (examples of which include -measure, Jaccard similarity coefficient, AM measure, and many others). Our analysis concerns the following two-step procedure. First, a real-valued function is learned by minimizing a surrogate loss for binary classification on the training sample. It is assumed that the surrogate loss is a strongly proper composite loss function (examples of which include logistic loss, squared-error loss, exponential loss, etc.). Then, given , a threshold is tuned on a separate validation sample, by direct optimization of the target performance metric. We show that the regret of the resulting classifier (obtained from thresholding on ) measured with respect to the target metric is upperbounded by the regret of measured with respect to the surrogate loss. We also extend our results to cover multilabel classification and provide regret bounds for micro- and macro-averaging measures. Our findings are further analyzed in a computational study on both synthetic and real data sets.
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(6)- Learning with mitigating random consistency from the accuracy measure
- On the Bayes-optimality of F-measure maximizers
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- Optimal rates for nonparametric F-score binary classification via post-processing
- On Loss Functions and Regret Bounds for Multi-Category Classification
- Goal scoring, coherent loss and applications to machine learning
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