A novel exact method for significance of higher criticism via Steck's determinant
From MaRDI portal
Publication:2407531
DOI10.1016/j.spl.2017.07.009zbMath1380.62197OpenAlexW2741164592MaRDI QIDQ2407531
David L. Tritchler, Daniel P. Gaile, Jiefei Wang, Jeffrey C. Miecznikowski
Publication date: 6 October 2017
Published in: Statistics \& Probability Letters (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.spl.2017.07.009
Nonparametric hypothesis testing (62G10) Order statistics; empirical distribution functions (62G30) Paired and multiple comparisons; multiple testing (62J15)
Related Items (3)
High precision implementation of Steck's recursion method for use in goodness-of-fit tests ⋮ Exceedance control of the false discovery proportion via high precision inversion method of berk-Jones statistics ⋮ Fast calculation of p-values for one-sided Kolmogorov-Smirnov type statistics
Uses Software
Cites Work
- Unnamed Item
- The asymptotic distribution of the supremum of the standardized empirical distribution function on subintervals
- Higher criticism for detecting sparse heterogeneous mixtures.
- Higher criticism: \(p\)-values and criticism
- Rectangle Probabilities for Uniform Order statistics and the Probability That the Empirical Distribution Function Lies Between Two Distribution Functions
This page was built for publication: A novel exact method for significance of higher criticism via Steck's determinant
