Electromigration failure of metal lines

DOI10.1007/S10704-006-0059-6zbMath1112.74484OpenAlexW4253012649MaRDI QIDQ2432249

Hiroyuki Abe, K. Sasagawa, Masumi Saka

Publication date: 25 October 2006

Published in: International Journal of Fracture (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s10704-006-0059-6

zbMATH Keywords

failureintegrated circuitElectromigrationthreshold current density

Mathematics Subject Classification ID

Fracture and damage (74R99)

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