Nanoindentation: a suitable tool to determine local mechanical properties in microelectronic packages and materials?
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Publication:2432398
DOI10.1007/S00419-005-0394-5zbMATH Open1158.74439OpenAlexW2062998917MaRDI QIDQ2432398FDOQ2432398
Authors: H.-J. Albrecht, T. Hannach, A. Häse, A. Juritza, Klaus-Robert Müller, Wolfgang H. Müller
Publication date: 25 October 2006
Published in: Archive of Applied Mechanics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1007/s00419-005-0394-5
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Cites Work
Cited In (10)
- Continuous stiffness measurements of layered materials used in magnetic storage devices
- Gripless nanotension test for determination of nano-scale properties
- Identification of material models of nanocoatings system using the metamodeling approach
- Estimation of FeB layer's yield strength by comparison of finite element modeling with experimental data
- Determining material parameter of solder alloys by nanoindentation
- Recovery of information on the depth-dependent profile of elastic FGMs from indentation experiments
- Contact stiffness indentation tomography: moduli-perturbation approach
- Simulation for measurements of electric properties of surface nanostructures
- On the Size Effects in Indentation Testing of Elastic Functionally-graded Materials
- Local mechanical properties of the 6061-T6 aluminium weld using micro-traction and instrumented indentation
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