Waiting time for an almost perfect run and applications in statistical process control

DOI10.1007/s11009-012-9307-6zbMath1296.60025OpenAlexW2063736493MaRDI QIDQ2445479

George K. Papadopoulos, Sotiris Bersimis, Markos V. Koutras

Publication date: 14 April 2014

Published in: Methodology and Computing in Applied Probability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s11009-012-9307-6

zbMATH Keywords

statistical process controlrunsaverage run lengthruns rulesscansMarkov chain embeddable random variablesalmost perfect run

Mathematics Subject Classification ID

Probability distributions: general theory (60E05)

Related Items (4)

Weak runs in sequences of binary trials ⋮ Binomial distribution of order \(k\) in a modified binary sequence ⋮ On distribution and average run length of a two-stage control process ⋮ New maximal inequalities for N-demimartingales with scan statistic applications

Cites Work

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• Chi-square control charts with runs rules
• Exact and asymptotic results for pattern waiting times
• Improving the performance of the chi-square control chart via runs rules
• System-wide probabilities for systems with runs and scans rules
• Waiting time problem for an almost perfect match.
• On the tail probability of the longest well-matching run.
• Statistical process control using Shewhart control charts with supplementary runs rules
• Distribution Theory of Runs: A Markov Chain Approach
• Distribution of the scan statistic for a sequence of bistate trials
• Scan statistics

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