Reliability tests for Weibull distribution with variational shape parameter based on sudden death lifetime data
DOI10.1016/J.EJOR.2007.05.043zbMATH Open1149.90325OpenAlexW2013801244MaRDI QIDQ2480997FDOQ2480997
Yuuki Kawamura, Yasuhiko Takemoto, Ikuo Arizono
Publication date: 7 April 2008
Published in: European Journal of Operational Research (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.ejor.2007.05.043
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Weibull distributionmean time to failurechi-square approximationacceptance sampling planreliability testsudden death testing
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Cited In (15)
- Optimal lot sentencing based on defective counts and prior acceptability
- An EPQ model with inflation in an imperfect production system
- Economic lot sampling inspection from defect counts with minimum conditional value-at-risk
- Optimum attributes component test plans for \(k\)-out-of-\(n:F\) Weibull systems using prior information
- Design of progressively censored group sampling plans for Weibull distributions: an optimization problem
- Generalized beta prior models on fraction defective in reliability test planning
- Optimal acceptance sampling plans for log-location-scale lifetime models using average risks
- Optimal lot disposition from Poisson-Lindley count data
- Title not available (Why is that?)
- Minimizing the area of a Pareto confidence region
- Sudden death testing versus traditional censored life testing. A Monte Carlo study
- Controlling posterior producer and consumer risks in lot reinspection
- Explicit quasi-optimal inspection schemes from nonconformity count data with controlled producer and consumer risks
- Classical versus Bayesian risks in acceptance sampling: a sensitivity analysis
- Balancing producer and consumer risks in optimal attribute testing: a unified Bayesian/frequentist design
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