An approach to self-diagnosis of a newly developed in digital systems
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Publication:2487579
DOI10.1007/S10513-005-0105-2zbMATH Open1081.94043OpenAlexW2001728942MaRDI QIDQ2487579FDOQ2487579
Authors: V. A. Vedeshenkov
Publication date: 8 August 2005
Published in: Automation and Remote Control (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1007/s10513-005-0105-2
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Cites Work
Cited In (5)
- An approach to self-diagnosis of nonuniform digital systems
- Zur Optimierung von Zuverlässigkeit und Nutzungsgrad von Systemen mit Selbstdiagnose
- On a Novel Self-test Approach to Digital Testing
- Local self-diagnosis of failed components in digital systems
- Self-diagnosis of digital systems containing units with self-checkable built-in testing circuits
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