Extending chi-squared statistics for key comparisons in metrology

DOI10.1016/J.CAM.2005.04.041MaRDI QIDQ2491748zbMATH OpenOpenAlexFDO

Authors Yanyan Li

Publication date 29 May 2006

Published in Journal of Computational and Applied Mathematics (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.cam.2005.04.041

zbMATH Keywords

null-hypothesis testingkey comparisonreference value

Mathematics Subject Classification ID

Nonparametric hypothesis testing (62G10) Applications of statistics in engineering and industry; control charts (62P30) Monte Carlo methods (65C05) Applications of statistics (62P99)

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Cites work

• A portable high-quality random number generator for lattice field theory simulations
• RANLUX: A Fortran implementation of the high-quality pseudorandom number generator of Lüscher

Cited in

(1)

• Precision Statistics: Fractional Number of Degrees of Freedom Chi-Square Criterion for Small Samples of Biometric Data

Describes a project that uses

Uses Software

• RANLUX

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