RVE-based studies on the coupled effects of void size and void shape on yield behavior and void growth at micron scales
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Publication:2495885
DOI10.1016/j.ijplas.2005.07.004zbMath1161.74341OpenAlexW2047331712MaRDI QIDQ2495885
Publication date: 30 June 2006
Published in: International Journal of Plasticity (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.ijplas.2005.07.004
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