Production quality and yield assurance for processes with multiple independent characteristics

DOI10.1016/j.ejor.2005.02.050zbMath1125.90345MaRDI QIDQ2496085

Wen Lea Pearn, Chien-wei Wu

Publication date: 30 June 2006

Published in: European Journal of Operational Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.ejor.2005.02.050

zbMATH Keywords

bootstrap sampling; process capability indices; lower confidence bound; MPPAC control chart

Mathematics Subject Classification ID

90B25: Reliability, availability, maintenance, inspection in operations research

90B30: Production models

Related Items

Construction of closed interval for process capability indicesC_pu,C_pl, andS_pkbased on Boole’s inequality and de Morgan’s laws, Optimal design of overall yield-based variable repetitive sampling plans for processes with multiple characteristics, A robust bootstrap control chart for the log-logistic percentiles

Cites Work

• Bootstrap methods for standard errors, confidence intervals, and other measures of statistical accuracy
• Bootstrap methods: another look at the jackknife
• Multivariate Process Analysis with Lattice Data
• On the distributions of the estimated process capability indices
• How Reliable is Your Capability Index?
• Distributional and inferential properties of the process accuracy and process precision indices
• Process capability analysis for an entire product
• Brocess capability with asymmetric tolerances
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