Production quality and yield assurance for processes with multiple independent characteristics
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Publication:2496085
Recommendations
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- Production yield measure for multiple characteristics processes based on \(S^T_{pk}\) under multiple samples
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- Quality assessment of a multistage process in the case of continuous response functions from resource influences
- Product and process parameters determination for quality and cost
Cites work
- Bootstrap methods for standard errors, confidence intervals, and other measures of statistical accuracy
- Bootstrap methods: another look at the jackknife
- Brocess capability with asymmetric tolerances
- Distributional and inferential properties of the process accuracy and process precision indices
- How Reliable is Your Capability Index?
- scientific article; zbMATH DE number 3782216 (Why is no real title available?)
- scientific article; zbMATH DE number 774888 (Why is no real title available?)
- Multivariate Process Analysis with Lattice Data
- On the distributions of the estimated process capability indices
- Process capability analysis for an entire product
Cited in
(17)- Sample size determination for production yield estimation with multiple independent process characteristics
- Real and complex QARMA processes
- A robust bootstrap control chart for the log-logistic percentiles
- A process targeting model for a product with two dependent quality characteristics using 100% inspection
- Measuring production yield for processes with multiple characteristics
- Multiple streams process capability analysis chart
- Designing the optimal process target levels for multiple quality characteristics
- Lower confidence bounds for C PU and C PL based on multiple samples with application to production yield assurance
- Quality-yield measure for production processes with very low fraction defective
- Quality assessment of a multistage process in the case of continuous response functions from resource influences
- Multivariate capability indices: distributional and inferential properties
- Construction of closed interval for process capability indicesCpu,Cpl, andSpkbased on Boole’s inequality and de Morgan’s laws
- scientific article; zbMATH DE number 2204509 (Why is no real title available?)
- Advanced multi-process performance analysis chart for an entire product with joint confidence regions
- Multiple-process performance analysis chart based on process loss indices
- A modified method on estimating and assessing the process yield with imprecise multiple characteristics
- Optimal design of overall yield-based variable repetitive sampling plans for processes with multiple characteristics
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