An independent component analysis-based filter design for defect detection in low-contrast surface images

DOI10.1016/j.patcog.2006.03.005zbMath1096.68762OpenAlexW2122146498MaRDI QIDQ2498658

Du-Ming Tsai, Ping-Chieh Lin, Chi-Jie Lu

Publication date: 16 August 2006

Published in: Pattern Recognition (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.patcog.2006.03.005

zbMATH Keywords

independent component analysissurface inspectionparticle swarm optimizationdefect detectionconvolution filter

Mathematics Subject Classification ID

Computing methodologies for image processing (68U10)

Related Items (2)

Defect detection of uneven brightness in low-contrast images using basis image representation ⋮ Defect detection in periodically patterned surfaces using independent component analysis

Cites Work

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• Face representation using independent component analysis
• Independent component analysis for texture segmentation.
• Liquid crystal display surface uniformity defect inspection using analysis of variance and exponentially weighted moving average techniques

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