Optimal lot size and inspection policy for products sold with warranty

DOI10.1016/j.ejor.2005.02.049zbMath1109.90037MaRDI QIDQ2503053

Ruey Huei Yeh, Tzu-Hui Chen

Publication date: 13 September 2006

Published in: European Journal of Operational Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.ejor.2005.02.049

zbMATH Keywords

warranty; lot size; deteriorating production system; product inspection

Mathematics Subject Classification ID

90B25: Reliability, availability, maintenance, inspection in operations research

90B30: Production models

Related Items

Utilizing the information theory of entropy to solve an off-line inspection problem, Utilizing an approximative solution to obtain the real optimal solution for a production and inspection model, Optimal lot size and offline inspection policy, Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing, Optimal production run time for a deteriorating production system under an extended inspection policy, Inventory models for imperfect production and inspection processes with various inspection options under one-time and continuous improvement investment, Maintenance models in warranty: a literature review, A common cycle approach for solving the economic lot and inspection scheduling problem, ECONOMIC PRODUCTION RUN LENGTH AND WARRANTY PERIOD FOR PRODUCT WITH WEIBULL LIFETIME

Cites Work

• Quality control and product servicing: A decision framework
• Product warranty management. I: A taxonomy for warranty policies
• Product warranty management. III: A review of mathematical models
• Lot sizing and testing for items with uncertain quality
• Quality Control for Products Supplied with Warranty
• Optimal Lot Sizing, Process Quality Improvement and Setup Cost Reduction
• Simultaneous determination of the optimal production-inventory and product inspection policies for a deteriorting production system