Calibration and validation of coarse-grained models of atomic systems: application to semiconductor manufacturing
DOI10.1007/S00466-014-1028-YzbMATH Open1398.74487OpenAlexW2024623348MaRDI QIDQ2512486FDOQ2512486
Authors: Kathryn Farrell, J. Tinsley Oden
Publication date: 7 August 2014
Published in: Computational Mechanics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1007/s00466-014-1028-y
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Statistical mechanics of semiconductors (82D37) Stochastic and other probabilistic methods applied to problems in solid mechanics (74S60) Random structure in solid mechanics (74E35)
Cites Work
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- A systematic approach to model validation based on Bayesian updates and prediction related rejection criteria
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- Virtual model validation of complex multiscale systems: applications to nonlinear elastostatics
- Selection and assessment of phenomenological models of tumor growth
- Divergence Estimation for Multidimensional Densities Via $k$-Nearest-Neighbor Distances
- Adaptive multiscale modeling of polymeric materials with Arlequin coupling and goals algorithms
- Bayesian validation assessment of multivariate computational models
Cited In (5)
- Construction of coarse-grained models by reproducing equilibrium probability density function
- An iterative Bayesian filtering framework for fast and automated calibration of DEM models
- Adaptive selection and validation of models of complex systems in the presence of uncertainty
- Predictive coarse-graining
- A Bayesian framework for adaptive selection, calibration, and validation of coarse-grained models of atomistic systems
Uses Software
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