Maximal margin classification for metric spaces

DOI10.1016/J.JCSS.2004.10.013MaRDI QIDQ2568461zbMATH OpenOpenAlexFDO

Authors Matthias Hein, Olivier Bousquet, Bernhard Schölkopf

Publication date 10 October 2005

Published in Journal of Computer and System Sciences (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.jcss.2004.10.013

zbMATH Keywords

classificationembeddingmaximum marginmetric spacespattern recognition

Mathematics Subject Classification ID

Metric spaces, metrizability (54E35) Classification and discrimination; cluster analysis (statistical aspects) (62H30) Learning and adaptive systems in artificial intelligence (68T05) Pattern recognition, speech recognition (68T10)

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Cites work

• 10.1162/15324430260185592
• 10.1162/153244303321897690
• Distance-based classification with Lipschitz functions
• Geometry of cuts and metrics
• scientific article; zbMATH DE number 4004880 (Why is no real title available?)
• scientific article; zbMATH DE number 729736 (Why is no real title available?)
• scientific article; zbMATH DE number 1022519 (Why is no real title available?)
• Metric spaces and completely monontone functions
• Metric Spaces and Positive Definite Functions
• Uniform embeddings of metric spaces and of Banach spaces into Hilbert spaces
• Universal Donsker classes and metric entropy

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(17)

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• Classification of companies using maximal margin ellipsoidal surfaces
• Generalized semi-inner products with applications to regularized learning
• Learning half-spaces on general infinite spaces equipped with a distance function
• Distance-based classification with Lipschitz functions
• Learning Theory and Kernel Machines
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• Learning Theory
• Adaptive metric dimensionality reduction
• On relative reproducing kernel Banach spaces: definitions, semi-inner product and feature maps
• Karush-Kuhn-Tucker conditions and Lagrangian approach for improving machine learning techniques: a survey and new developments
• Shape analysis of AF segments for rapid assessment of Mohs layers for BCC presence by AF-Raman microscopy
• Regularized learning in Banach spaces as an optimization problem: representer theorems
• On the smallest possible dimension and the largest possible margin of linear arrangements representing given concept classes
• Kernel methods in machine learning

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