Finite difference fractional step methods for the transient behavior of a semiconductor device

DOI10.1016/S0252-9602(05)60006-9zbMath1118.65360MaRDI QIDQ2569254

Yi-Rang Yuan

Publication date: 18 October 2005

Published in: Acta Mathematica Scientia. Series B. (English Edition) (Search for Journal in Brave)

zbMATH Keywords

characteristic finite difference; \(l^2\) error estimate; 3-dimensional heat conduction; general region semiconductor device; parallel fractional steps

Mathematics Subject Classification ID

35K05: Heat equation

65M06: Finite difference methods for initial value and initial-boundary value problems involving PDEs

82D37: Statistical mechanics of semiconductors

65M15: Error bounds for initial value and initial-boundary value problems involving PDEs