Diagnosing manufacturing variation using second-order and fourth-order statistics

DOI10.1023/B:FLEX.0000039172.84756.39zbMATH Open1093.90011MaRDI QIDQ2575334FDOQ2575334

Authors: Ho Young Lee, Daniel W. Apley 

Publication date: 8 December 2005

Published in: International Journal of Flexible Manufacturing Systems (Search for Journal in Brave)

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Mathematics Subject Classification ID

Production models (90B30)

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• Root cause analysis of manufacturing variation from optical scanning data
• Analyzing Nonparametric Part-to-Part Variation in Surface Point Cloud Data
• Data‐driven variation source identification for manufacturing process using the eigenspace comparison method
• An exploratory analysis approach for understanding variation in stochastic textured surfaces
• Quantifying the variance contribution of special cause mean shifts in reconfigurable batch manufacturing processes

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