Diagnosing manufacturing variation using second-order and fourth-order statistics

DOI10.1023/B:FLEX.0000039172.84756.39MaRDI QIDQ2575334zbMATH OpenFDO

Authors Ho Young Lee, Daniel W. Apley

Publication date 8 December 2005

Published in International Journal of Flexible Manufacturing Systems (Search for Journal in Brave)

Mathematics Subject Classification ID

Production models (90B30)

Recommendations

• Data‐driven variation source identification for manufacturing process using the eigenspace comparison method
• scientific article; zbMATH DE number 1121367
• Statistical monitoring and diagnosis of automatic controlled processes using dynamic PCA
• A comparative study of different methodologies for fault diagnosis in multivariate quality control
• Model-based diagnosis of special causes in statistical process control

Cited in

(5)

• Quantifying the variance contribution of special cause mean shifts in reconfigurable batch manufacturing processes
• Root cause analysis of manufacturing variation from optical scanning data
• Analyzing Nonparametric Part-to-Part Variation in Surface Point Cloud Data
• Data‐driven variation source identification for manufacturing process using the eigenspace comparison method
• An exploratory analysis approach for understanding variation in stochastic textured surfaces

This page was built for publication: Diagnosing manufacturing variation using second-order and fourth-order statistics

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q2575334)