Two sides of probe method and obstacle with impedance boundary condition

DOI10.14492/HOKMJ/1285766423zbMATH Open1121.35139arXivmath/0611218OpenAlexW2072990157MaRDI QIDQ2641683FDOQ2641683

Authors: Masaru Ikehata 

Publication date: 23 August 2007

Published in: Hokkaido Mathematical Journal (Search for Journal in Brave)

Abstract: An inverse boundary value problem for the Helmholtz equation in a bounded domain is considered. The problem is to extract information about an unknown obstacle embedded in the domain with unknown impedance boundary condition (the Robin condition) from the associated Dirichlet-to-Neumann map. The main result is a characterization of the unknown obstacle via the sequences that are constructed by the Dirichlet-to-Neumann map, under smallness conditions on the wave number and the upper bound of the impedance. Moreover two alternative simple proofs of a previous result of Cheng-Liu-Nakamura which are based on only some energy estimates, an analysis of the blowup of the energy of so-called reflected solutions and an application of the enclosure method to the problem are also given.

Full work available at URL: https://arxiv.org/abs/math/0611218

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zbMATH Keywords

blowupDirichlet-to-Neumann mapinverse obstacle scatteringimpedance boundary conditionneedle sequencePoincaré inequality

Mathematics Subject Classification ID

Boundary value problems for second-order elliptic equations (35J25) Inverse problems for PDEs (35R30) Inverse problems (including inverse scattering) in optics and electromagnetic theory (78A46)

Cited In (6)

• Extracting the geometry of an obstacle and a zeroth-order coefficient of a boundary condition via the enclosure method using a single reflected wave over a finite time interval
• Integrating the probe and singular sources methods
• Reconstruction of the defect by the enclosure method for inverse problems of the magnetic Schrödinger operator
• A remark on the reconstruction formula of the support function for the magnetic Schrödinger operator
• Extracting discontinuity using the probe and enclosure methods
• Revisiting the probe and enclosure methods

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