Application of the Bayes' theory to the failure rate evaluation of electrical apparatus

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Publication:2644565

DOI10.1631/JZUS.2007.A0501zbMATH Open1116.78337OpenAlexW2351310468MaRDI QIDQ2644565FDOQ2644565


Authors: Shaohua Jin, Jianguo Lu, Yan-Ping Wan, Shuguang Sun Edit this on Wikidata


Publication date: 3 September 2007

Published in: Journal of Zhejiang University. Science A (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1631/jzus.2007.a0501




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