Improvement of the contraction-type LP test algorithm for finding all solutions of piecewise-linear resistive circuits

DOI10.1002/CTA.159MaRDI QIDQ2764568zbMATH OpenOpenAlexFDO

Authors Kiyotaka Yamamura, Shigeru Tanaka

Publication date 1 May 2003

Published in International Journal of Circuit Theory and Applications (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1002/cta.159

Mathematics Subject Classification ID

Linear programming (90C05) Applications of mathematical programming (90C90) Analytic circuit theory (94C05)

Cites work

• An algorithm for finding all solutions of piecewise-linear resistive circuits
• An efficient algorithm for finding all solutions of piecewise-linear resistive circuits
• Finding all solutions of piecewise-linear resistive circuits using linear programming
• Performance evaluation of the LP test algorithm for finding all solutions of piecewise-linear resistive circuits

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