A general lower bound of parameter estimation for reflected Ornstein-Uhlenbeck processes
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Publication:2804409
DOI10.1017/JPR.2015.5zbMATH Open1342.60136OpenAlexW2300358603MaRDI QIDQ2804409FDOQ2804409
Publication date: 29 April 2016
Published in: Journal of Applied Probability (Search for Journal in Brave)
Full work available at URL: https://projecteuclid.org/euclid.jap/1457470555
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Asymptotic properties of parametric estimators (62F12) Diffusion processes (60J60) Strong limit theorems (60F15)
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Cited In (10)
- An exponential nonuniform Berry-Esseen bound for the fractional Ornstein-Uhlenbeck process
- Sequential estimation for nonhomogeneous Ornstein-Uhlenbeck processes
- Cramér-type moderate deviations for statistics in the non-stationary Ornstein–Uhlenbeck process
- Maximum likelihood estimation for reflected Ornstein-Uhlenbeck processes with jumps
- An exponential nonuniform Berry-Esseen bound of the maximum likelihood estimator in a Jacobi process
- Trajectory fitting estimation for reflected stochastic linear differential equations of a large signal
- Asymptotic properties for the parameter estimation in Ornstein-Uhlenbeck process with discrete observations
- Maximum likelihood estimation for the reflected stochastic linear system with a large signal
- Moderate deviations for drift parameter estimations in reflected Ornstein-Uhlenbeck process
- Piecewise-tunneled captive processes and corridored random particle systems
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