A Bayesian Goodness of Fit Test and Semiparametric Generalization of Logistic Regression with Measurement Data

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Publication:2846460

DOI10.1111/biom.12007zbMath1274.62871OpenAlexW1905300767WikidataQ30598262 ScholiaQ30598262MaRDI QIDQ2846460

Adam J. Branscum, Timothy E. Hanson, Angela Schörgendorfer

Publication date: 5 September 2013

Published in: Biometrics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1111/biom.12007




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