Nonparametric comparison of recurrent event processes based on panel count data
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Publication:287405
DOI10.1016/J.JKSS.2015.11.001zbMATH Open1338.62138OpenAlexW2176081515MaRDI QIDQ287405FDOQ287405
Authors: Da Xu, Dehui Wang, Jianguo Sun
Publication date: 26 May 2016
Published in: Journal of the Korean Statistical Society (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.jkss.2015.11.001
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Cites Work
- Analysing panel count data with informative observation times
- Semiparametric Regression for the Mean and Rate Functions of Recurrent Events
- Two likelihood-based semiparametric estimation methods for panel count data with covariates
- Nonparametric \(k\)-sample tests with panel count data
- Robust Tests for Treatment Comparisons Based on Recurrent Event Responses
- New multi-sample nonparametric tests for panel count data
- A Class of Two-Sample Nonparametric Tests for Panel Count Data
- A nonparametric test for panel count data
- Semiparametric regression analysis of panel count data with informative observation times
- A class of multi-sample nonparametric tests for panel count data
- Nonparametric tests for panel count data with unequal observation processes
- Robust estimation for panel count data with informative observation times
- Nonparametric comparison for panel count data with unequal observation processes
- Statistical analysis of panel count data
- Regression analysis of multivariate panel count data with an informative observation process
- Semiparametric estimation of treatment effects in two sample problems with censored data
- Analysis of repeated events
Cited In (8)
- Nonparametric inference based on panel count data
- Nonparametric inference for panel count data with competing risks
- New multi-sample nonparametric tests for panel count data
- Nonparametric tests for panel count data with unequal observation processes
- Nonparametric comparison for panel count data with unequal observation processes
- Nonparametric inference for continuous-time event counting and link-based dynamic network models
- Nonparametric comparison for multivariate panel count data
- A nonparametric test for panel count data
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