Importance Sampling for Determining SRAM Yield and Optimization with Statistical Constraint

DOI10.1007/978-3-642-22453-9_5zbMath1247.78053OpenAlexW1823439846MaRDI QIDQ2902762

T. S. Doorn, Th. Beelen, E. Jan W. ter Maten, Alessandro Di Bucchianico, Olaf Wittich

Publication date: 22 August 2012

Published in: Scientific Computing in Electrical Engineering SCEE 2010 (Search for Journal in Brave)

Full work available at URL: https://research.tue.nl/nl/publications/49ddc992-e024-4b9f-9b94-43731bb15837

zbMATH Keywords

Monte Carlo samplinglarge deviation theorystatic random access memory (SRAM)

Mathematics Subject Classification ID

Large deviations (60F10) Sampling theory in information and communication theory (94A20) Optimization problems in optics and electromagnetic theory (78M50) Monte Carlo methods applied to problems in optics and electromagnetic theory (78M31)

Cites Work

• Introduction to rare event simulation.
• Unnamed Item

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