Antirandom test vectors for BIST in hardware/software systems

zbMATH Open1285.68018MaRDI QIDQ2909628FDOQ2909628

Authors: Ireneusz Mrozek, Vyacheslav Yarmolik 

Publication date: 6 September 2012

Published in: Fundamenta Informaticae (Search for Journal in Brave)

Full work available at URL: http://iospress.metapress.com/content/u35u17m666tw02q2/fulltext.html

Recommendations

• On evaluating and optimizing weights for weighted random pattern testing
• Advances in Computer Science - ASIAN 2004. Higher-Level Decision Making
• Controlled random tests
• Provably good pattern generators for a random pattern test
• On Random Pattern Test Length

zbMATH Keywords

software testingrandom testinghardware testingfailure patternantirandom testing

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15) Mathematical aspects of software engineering (specification, verification, metrics, requirements, etc.) (68N30)

Cited In (1)

• Synthesis of test sequences with a given switching activity

This page was built for publication: Antirandom test vectors for BIST in hardware/software systems

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q2909628)