Locally testable codes and Cayley graphs

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Publication:2988869

DOI10.1145/2554797.2554807zbMATH Open1364.94753arXiv1308.5158OpenAlexW2104333656MaRDI QIDQ2988869FDOQ2988869


Authors: Parikshit Gopalan, Yuan Zhou, Salil Vadhan Edit this on Wikidata


Publication date: 19 May 2017

Published in: Proceedings of the 5th conference on Innovations in theoretical computer science (Search for Journal in Brave)

Abstract: We give two new characterizations of (F2-linear) locally testable error-correcting codes in terms of Cayley graphs over F2h: �egin{enumerate} item A locally testable code is equivalent to a Cayley graph over F2h whose set of generators is significantly larger than h and has no short linear dependencies, but yields a shortest-path metric that embeds into ell1 with constant distortion. This extends and gives a converse to a result of Khot and Naor (2006), which showed that codes with large dual distance imply Cayley graphs that have no low-distortion embeddings into ell1. item A locally testable code is equivalent to a Cayley graph over F2h that has significantly more than h eigenvalues near 1, which have no short linear dependencies among them and which "explain" all of the large eigenvalues. This extends and gives a converse to a recent construction of Barak et al. (2012), which showed that locally testable codes imply Cayley graphs that are small-set expanders but have many large eigenvalues. end{enumerate}


Full work available at URL: https://arxiv.org/abs/1308.5158




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