An Approximation of Three-Dimensional Semiconductor Devices by Mixed Finite Element Method and Characteristics-Mixed Finite Element Method

DOI10.4208/nmtma.2015.my12031zbMath1363.82009MaRDI QIDQ2991818

Qing Yang, Yi-Rang Yuan

Publication date: 10 August 2016

Published in: Numerical Mathematics: Theory, Methods and Applications (Search for Journal in Brave)

Full work available at URL: https://semanticscholar.org/paper/42a945cbd8ee501ba0097ec16f473fd56f388ad5

zbMATH Keywords

error bound; characteristics-mixed finite element method; post-processing step; three-dimensional semiconductor devices

Mathematics Subject Classification ID

82D37: Statistical mechanics of semiconductors

65M60: Finite element, Rayleigh-Ritz and Galerkin methods for initial value and initial-boundary value problems involving PDEs

65M15: Error bounds for initial value and initial-boundary value problems involving PDEs