Bias corrections in testing and estimating semiparametric, single index models
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Publication:2995419
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Cites work
- A Consistent Conditional Moment Test of Functional Form
- An Adaptive, Rate-Optimal Test of a Parametric Mean-Regression Model Against a Nonparametric Alternative
- An Efficient Semiparametric Estimator for Binary Response Models
- Approximation Theorems of Mathematical Statistics
- Comparing nonparametric versus parametric regression fits
- Maximum Likelihood Specification Testing and Conditional Moment Tests
- Nonparametric and Semiparametric Estimation with Discrete Regressors
- Probability Inequalities for Sums of Bounded Random Variables
- Semiparametric Estimation of Index Coefficients
- Semiparametric Specification Testing of Non-nested Econometric Models
- Semiparametric estimation in single index Poisson regression: A practical approach
- Semiparametric estimation of a censored regression model with an unknown transformation of the dependent variable
- Semiparametric least squares (SLS) and weighted SLS estimation of single-index models
- Semiparametric single index versus fixed link function modelling
- Shift Restrictions and Semiparametric Estimation in Ordered Response Models
- Simulation and the Asymptotics of Optimization Estimators
- Specification test for binary choice models based on index quantiles
- Testing Parametric versus Semiparametric Modeling in Generalized Linear Models
- Testing conditional moment restrictions
- Twicing Kernels and a Small Bias Property of Semiparametric Estimators
Cited in
(8)- Estimation for biased partial linear single index models
- Recursive differencing for estimating semiparametric models
- An IV estimator for a functional coefficient model with endogenous discrete treatments
- Estimation of marginal effects in semiparametric selection models with binary outcomes
- Twicing Kernels and a Small Bias Property of Semiparametric Estimators
- Analysis of double single index models
- A semiparametric single index model with heterogeneous impacts on an unobserved variable
- A bias-adjusted LM test of error cross-section independence
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