Determination of the complex refractive index of porous silicon layers on crystalline silicon substrates

DOI10.1142/S0217979210054932MaRDI QIDQ3010873zbMATH OpenFDO

Authors M. C. Arenas, Hailin Hu, R. Nava, J. A. del Río

Publication date 27 June 2011

Published in International Journal of Modern Physics B (Search for Journal in Brave)

zbMATH Keywords

porous siliconcomplex refractive indexabsorbing substrate

Mathematics Subject Classification ID

Statistical mechanics of semiconductors (82D37) Statistical mechanics of nanostructures and nanoparticles (82D80)

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• Optical absorption measurement at 1550 nm on a highly-reflective Si/SiO ₂ coating stack
• Reflectometry measuring refractive index and thickness of polymer samples simultaneously

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