Determination of the complex refractive index of porous silicon layers on crystalline silicon substrates

DOI10.1142/S0217979210054932zbMATH Open1219.82237MaRDI QIDQ3010873FDOQ3010873

Authors: M. C. Arenas, Hailin Hu, R. Nava, J. A. del Río 

Publication date: 27 June 2011

Published in: International Journal of Modern Physics B (Search for Journal in Brave)

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zbMATH Keywords

porous siliconcomplex refractive indexabsorbing substrate

Mathematics Subject Classification ID

Statistical mechanics of semiconductors (82D37) Statistical mechanics of nanostructures and nanoparticles (82D80)

Cited In (2)

• Optical absorption measurement at 1550 nm on a highly-reflective Si/SiO ₂ coating stack
• Reflectometry measuring refractive index and thickness of polymer samples simultaneously

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