Pattern analysis and metrology: the extraction of stable features from observable measurements

DOI10.1098/RSPA.2004.1291zbMATH Open1071.68547OpenAlexW2038616176MaRDI QIDQ3024587FDOQ3024587

Paul J. Scott

Publication date: 1 July 2005

Published in: Proceedings of the Royal Society of London. Series A: Mathematical and Physical Sciences (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1098/rspa.2004.1291

zbMATH Keywords

measurement theorymotif analysispattern analysismorphological closing filters

Mathematics Subject Classification ID

Measurement theory in the social and behavioral sciences (91C05) Pattern recognition, speech recognition (68T10) Meteorology and atmospheric physics (86A10)

Cited In (1)

• A Statistical Approach to Surface Metrology for 3D-Printed Stainless Steel

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