An Easily Testable Design of Programmable Logic Arrays for Multiple Faults

DOI10.1109/TC.1983.1676154zbMath0525.94025OpenAlexW1845681645MaRDI QIDQ3041100

K. K. Saluja, K. Kinoshita, Hideo Fujiwara

Publication date: 1983

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.1983.1676154

zbMATH Keywords

fault detectionprogrammable logic arraysmultiple faultscross-point faultsstuck-type faults

Mathematics Subject Classification ID

Related Items (3)

Direct numerical simulation of laminar-turbulent flow over a flat plate at hypersonic flow speeds ⋮ A testable design of programmable logic arrays with universal control and minimal overhead ⋮ Direct numerical simulation of the laminar-turbulent transition at hypersonic flow speeds on a supercomputer

This page was built for publication: An Easily Testable Design of Programmable Logic Arrays for Multiple Faults