Exhaustive Test Pattern Generation with Constant Weight Vectors
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Publication:3041102
DOI10.1109/TC.1983.1676175zbMath0525.94026OpenAlexW2008618370MaRDI QIDQ3041102
Publication date: 1983
Published in: IEEE Transactions on Computers (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/tc.1983.1676175
constant weight codestest pattern generationfault testingexhaustive testingself-testingmultilevel logicVLSI testinglogic testingscan path
Related Items (4)
The use of linear sums in exhaustive testing ⋮ A greedy algorithm to construct covering arrays using a graph representation ⋮ Partitioning circuits for improved testability ⋮ On \(n\)-column 0,1-matrices with all \(k\)-projections surjective
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