Exhaustive Test Pattern Generation with Constant Weight Vectors

DOI10.1109/TC.1983.1676175zbMath0525.94026OpenAlexW2008618370MaRDI QIDQ3041102

Donald T. Tang, Lin Woo

Publication date: 1983

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.1983.1676175

zbMATH Keywords

constant weight codestest pattern generationfault testingexhaustive testingself-testingmultilevel logicVLSI testinglogic testingscan path

Mathematics Subject Classification ID

Related Items (4)

The use of linear sums in exhaustive testing ⋮ A greedy algorithm to construct covering arrays using a graph representation ⋮ Partitioning circuits for improved testability ⋮ On \(n\)-column 0,1-matrices with all \(k\)-projections surjective

This page was built for publication: Exhaustive Test Pattern Generation with Constant Weight Vectors