scientific article; zbMATH DE number 2089810

zbMATH Open1045.68951MaRDI QIDQ3047692FDOQ3047692

Authors: Dane Walsh, Christian Omlin 

Publication date: 12 August 2004

Full work available at URL: http://link.springer.de/link/service/series/0558/bibs/2358/23580036.htm

Title of this publication is not available (Why is that?)

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Mathematics Subject Classification ID

Learning and adaptive systems in artificial intelligence (68T05) Computing methodologies and applications (68U99) Machine vision and scene understanding (68T45)

Cited In (3)

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• Parameter detection of thin films from their X-ray reflectivity by support vector machines.
• Paper sheet defects classification based on support vector machine method

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