Accurate prediction of the volume inversion impact on undoped double gate MOSFET capacitances
DOI10.1002/JNM.745zbMATH Open1204.78017OpenAlexW4239377498MaRDI QIDQ3064052FDOQ3064052
Authors: Oana Moldovan, Ferney A. Chaves, David Jiménez, Jean-Pierre Raskin, Benjamin Iñiguez
Publication date: 20 December 2010
Published in: International Journal of Numerical Modelling: Electronic Networks, Devices and Fields (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1002/jnm.745
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